Fourier Transform (FT) Photoluminescence (PL) Spectroscopy

Fourier Transform (FT) Photoluminescence (PL) Spectroscopy
ATP8900FTPL
Photoluminescence(PL) spectroscopy is effective tool of Non Destructive Testing, widely applied to semiconductor analysis such as the measurement of the band gap, inpurity defects, conpound semicondunctor, and quality validation.
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Description
Photoluminescence(PL) spectroscopy is effective tool of Non Destructive Testing, widely applied to semiconductor analysis such as the measurement of the band gap, inpurity defects, conpound semicondunctor, and quality validation. In the infrared photoluminence range with disadvantage of weak signal, even experienced operator takes tedious time and energy to commissioning can result in weak PL spectral signal. 
Compared with traditional dispersive spectrometer, Fourier transform FT spectroscopy based on mature theory and instrumentation, result in many advantages such as multi-channels, throughput, low noise, fast scan, and with sensitivity and SNR is significant higher. 
Based on 20 years experience in researching weak signal and PL spectroscopy, launch this fourier transfrom infrared photoluminescence spectrometer.
ATP8900PL features excellent sensitivity in the infrared range, super fast scan speed, easy-to-operate for expert and non-expert. It covers the range of 4000-12500cm-1 (800-2500nm), wtih a continous modulation of pumped laser power,  and sample temperature from room temperature up to 77K.

Features:
Higher sensitivity to weak signal in the infrared range
Fast scan speed < 1second
Non-expert operation
Broadrange of 4000-12500cm-1 (800-2500nm)
Higher spectral accuracy thanks to continous modulation of pumped laser power
Sample temperature from room temperature up to 77K.
Multi-channel, high throughput, low noise and higher SNR

Application:
Advanced optoelectronic material research 
Rare earth photoluminescence material performance check
Semiconductor wafer quality inspection
Infrared optoelectronic device quality control