High Resolution Spectrometer

High Resolution Spectrometer
1 unit
Made in China
Optosky ATP2400 with compact size and higher resolution, it uses Hamamatsu s13496 4096 pixels sensor, miniature OEM spectrometer manufacturer, customize design 185nm-1100nm.


After 20 years of experience in the development of optical fiber spectrometer, Optosky launched a new generation of high-performance ultra-thin fiber spectrometer: ATP2400-4, which has built-in pulsed xenon lamp drive circuits, adopts high sensitivity linear CMOS, and specially customized ultra-low noise CMOS signal processing circuits, which greatly reduces The noise of the sensor is lower, the signal-to-noise ratio is obtained (about twice higher than that of similar competitors), and the measurement reliability of the ATP2400-4 is improved. The measurement results do not change with the ambient temperature, which is the best level in the industry.
ATP2400-4 spectrometer can receive SMA905 fiber input light or free space light, and output spectral data measured through USB2.0 or UART ports.
ATP2400-4 spectrometer only requires a 5V DC power supply or USB power supply, which is very easy to integrate.


  • High resolution;
  • Fiber input and signal output are on the same side, which is very easy to integrate.
  • Detector: linear CMOS
  • Detector pixel: 4096 pixels
  • Ultra-low noise CMOS signal processing circuit
  • Spectral range: 180-1100nm
  • Spectral resolution: 0.1-2 nm (depending on spectral range, slit width)
  • Optical Design: cross-C-T
  • spectrometer Built-in pulsed xenon lamp driver
  • Integration time: 0.1 ms-256s
  • Vinner power supply: DC 5V±10% or USB power supply
  • A16 bit, 2MHz ADC
  • spectrometer Incident Interface: SMA905 or free space
  • Supported data output interface: USB 2.0 (High speed ) or UART
  • 20-pin dual-row programmable external expansion interface


  • Fast and ultra-micro spectrophotometer;
  • Environmental protection equipment (flue gas, water quality);
  • Reflection and transmission spectrum detection;
  • Spectral analysis, radiation spectroscopic analysis, spectrophotometric analysis;
  • Laser wavelength measurement.