IR Grating Spectrometer
ATP7810
ATP7810 is a wide-band range, high-resolution spectrometer launched by Optosky with 20 years of experience in spectrometer development. After 5 years of research and development, ATP7810 rotates the grating through software control and performs wavelength scanning to obtain highly accurate spectral measurement results.
Delivery
FOB
minimum order
1 unit
Country of Origin
Made in China
Quantity
Description:
ATP7810 is Optosky's 20 years of spectrometer development experience. After 5 years of research and development, it launched a wide-band range and high-resolution spectrometer. ATP7810 rotates the grating through software control and performs wavelength scanning to obtain high-precision spectral measurement results.
The ATP7810 system utilizes a simulation-optimized optical system to ensure high resolution. The ATP7810 series has a variety of input and output options, providing researchers with endless possibilities, scalability and diversity. Both single-point detectors and various array cameras can be used.
0.8~2.5μm, 1.0~5.0μm, 1.0~12.0μm, 1.0~15.0μm, 1.0~26.0μ, which can cover the range from near-infrared to mid-to-far infrared, just choose the right one The grating can have more freedom in the choice of wavelength and resolution.
Feature:
- Ultra-wide band range, up to 26.0μm
- Six selectable wavelength ranges available, with other wavelength ranges optional
- High signal-to-noise ratio and high dynamic range
- TEC deep cooling detector, no need to add liquid nitrogen
- Built-in chopper and filter (if required)
- Power supply: DC 12V@<2A (max)
- ADC bit depth: 24 bits
- Various optical input interfaces: SM905 optical fiber interface or free space input
- Various types of detectors are available
- Designed with rotating concave grating
- Data output interface: USB2.0 and UART
- 15-pin extension interface, external trigger signal
Application:
- Absorption, reflection, transmission spectra
- Surface Spectrum
- IR
Selection Table:
Model | Spectral range | Best resolution/nm | Fastest scoring time | Detector Cooling | |
ATP7810-25 | 0.8~2.5μm | 10nm | 40s | Yes，-30℃ | |
ATP7810-50 | 1.0~5.0μm | 15nm | 50s | Yes，-30℃ | |
ATP7810H-50 | 1.0~5.0μm | 15nm | 10s | Yes，-30℃ | |
ATP7810-120 | 1.0~12.0μm | 40nm | 120s | Yes，-40℃ | |
ATP7810-150 | 1.0~15.0μm | 40nm | 120s | Yes，-40℃ | |
ATP7810-260 | 1.0~26.0μm | 60nm | 250s | Yes，-20℃ | |
Note：
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