Angle-Resolved Spectrometer

GY8100
The GY8100 integrates Optosky's spectral technology with a precision optical system, designed specifically for multi-angle spectral measurement needs.
Delivery
FOB
minimum order
1 unit
Country of Origin
Made In China
Quantity
Contact Now
Description
 
The GY8100 integrates Optosky's spectral technology with a precision optical system, designed specifically for multi-angle spectral measurement needs. Through a high-precision electric rotating arm, the GY8100 can precisely control the optical path for 360° spatial rotation, paired with a high signal-to-noise ratio spectrometer, supporting absolute spectral efficiency detection.
The GY8100 can be used for rapid measurement of the reflection, transmission, and other spectra of various planar optical components. It adopts an intelligent automatic rotation design, adjusting the incident and outgoing directions separately, to achieve spectral measurements at different angles of the sample under test. The measurement modes include: upper reflection, lower reflection, transmission, scattering, radiation, free mode, and programming mode. It aims to provide users with a more multidimensional, broader wavelength range high-precision spectral analysis experience, meeting the application needs of fields such as micro-nano optics, photonic crystals, superconducting materials, and luminescent materials.
 
Features
 
  • Full-angle acquisition uses intelligent rotation design and supports 0-360° measurement.
  • Multiple modes Support 7 spectral measurement modes.
  • Wide spectrum range Supports spectral range detection from 200-2500nm.
  • Supports expansion Can connect external light sources such as lasers.
  • Multi-dimensional control Samples support multi-mode and multi-dimensional adjustment.
  • Data analysis Proprietary software can realize automated spectral acquisition, data analysis and spectral display.
  • Secondary development Provides a development toolkit to encapsulate all functions, add in one place, call in multiple places.
 
Application
 
  • Structural Colors: The fundamental attribute of structural colors is their colorful appearance at different angles, necessitating the system to have multi-angle spectral detection capabilities.
  • Photonic Crystals: Photonic crystals achieve precise control over light beam characteristics such as polarization, direction, and frequency through their tunable band structure. Therefore, the system must have the capability to accurately characterize the band structure to guide the optimization of preparation processes.
  • Optical Thin Films: Thin films exhibit different reflectance at various angles, so the system must be able to accurately measure the reflectance data of thin films at different angles for comprehensive performance evaluation and optimization.
  • Luminescent Materials: The light intensity distribution is a crucial indicator for luminescent materials. Thus, the system needs to have the ability to receive luminescent information from all directions.
  • Metamaterials
  • Nanomaterials
  • Surface Plasmons
  • Gratings
  • Liquid Crystal Materials
  • Superlattice Materials