Automatic Octave Integrating Reflectometer
SM120
SM120 is used in the monitoring of the cell velvet process, providing customers with an effective detection solution for cell quality control and loss reduction.
Quantity
Description
In the field of solar cell manufacturing, obtaining the reflectivity of solar silicon wafers is extremely important for production control and research, but due to the special surface of the velvet, it is very difficult to measure its reflectivity.
Optosky's new fully automatic octave-angle integral reflectometer SM120, based on ISO7724 and DIN5033 standards and combined with years of experience in spectral instrument development, is the best solution to this problem. SM120 is used in the monitoring of the cell velvet process, providing customers with an effective detection solution for cell quality control and loss reduction.
Features
- Fully automatic computer control, automatic calibration, fast and accurate measurement;
- Supports fully automatic two-dimensional scanning (Mapping);
- Automatic calculation of multi-point average reflectivity;
- Ultra-long life light source;
- Reasonable structural design, simple operation and convenient maintenance;
- Ensure stable operation of the equipment without frequent calibration.
Application
- Solar Photovoltaic Industry