P/N Checker
SM500
EXW
1
Made In China
7Day
SM500 checker uses surface photovoltage technology to determine PN models quickly and without damage.
Quantity
Description
SM500checker uses surface photovoltage technology to determine PN models quickly and without damage.
SM500 uses the surface photovoltage method to measure PN types. The polarity of the surface barrier of the semiconductor material characterizes the material type. The polarity of the surface barrier can be measured by a non-contact surface photovoltage measurement method. This method uses a chopping laser to cut the surface barrier. The change in barrier due to light irradiation is measured by a surface-coupled capacitor probe. The PN model is derived from the polarity of the change in the surface barrier caused by light irradiation.
SM500checker built-in lithium battery, using BQ27520 power management chip, USB interface charging, a single full charge can be tested up to 15,000 times.

Features
Portable, contactless PN checker
Based on the test principle of surface photovoltage method, the injection depth is 5μm
No sample pretreatment required
PN model of any shape sample
Test resistivity range: >20 m.ohm
Test time: 0.5s
Two-color LED display test results
Built-in lithium battery, the number of battery life measurements > 10,000 times Fast scan a cycle of four channels within 5s

Application
Polysilicon purification/ingoting, direct to monocrystalline, chip, cell production
Measure monopolysilicon samples of any shape